Characterization of Different Length Scales and Periodicities inGe/Si Microstructures by Raman Spectroscopy: Theory and Experiment

✍ Scribed by M. A. Araújo Silva; E. Ribeiro; P. A. Schulz; F. Cerdeira; J. C. Bean

• Book ID: 111989741
• Publisher: John Wiley and Sons
• Year: 1996
• Tongue: English
• Weight: 602 KB
• Volume: 27
• Category: Article
• ISSN: 0377-0486
• DOI: 10.1002/(sici)1097-4555(199603)27:3/4<257::aid-jrs954>3.0.co;2-o