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Characterization of dielectric films and damage threshold at 1.064 μm

✍ Scribed by Akhtar, S. M. J. ;Ristau, D. ;Ebert, J. ;Welling, H.

Book ID: 105381524
Publisher: John Wiley and Sons
Year: 1989
Tongue: English
Weight: 1005 KB
Volume: 115
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211150120

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