✦ LIBER ✦
Characterization of defects in undoped non c-plane and high resistance GaN layers dominated by stacking faults
✍ Scribed by H. Witte; K.-M. Guenther; M. Wieneke; J. Blaesing; A. Dadgar; A. Krost
- Book ID
- 103887798
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 364 KB
- Volume
- 404
- Category
- Article
- ISSN
- 0921-4526
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