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Characterization of defects formed in amorphous SiO2 by high energy ions using electron spin resonance and optical spectroscopy

✍ Scribed by E. Dooryhee; Y. Langevin; J. Borg; J-P. Duraud; E. Balanzat


Book ID
113279018
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
375 KB
Volume
32
Category
Article
ISSN
0168-583X

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