Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films

✍ Scribed by C.H. Chen; T. Kiguchi; A. Saiki; N. Wakiya; K. Shinozaki; N. Mizutani

• Book ID: 106018701
• Publisher: Springer
• Year: 2003
• Tongue: English
• Weight: 331 KB
• Volume: 76
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-002-1951-1