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Characterization of deep centers in undoped semi-insulating GaAs substrates by normalized thermally stimulated current spectroscopy: Comparison of 100 and 150 mm wafers

โœ Scribed by Z. Q. Fang; D. C. Look; M. G. Mier


Book ID
107457778
Publisher
Springer US
Year
1998
Tongue
English
Weight
239 KB
Volume
27
Category
Article
ISSN
0361-5235

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