Characterization of deep centers in undoped semi-insulating GaAs substrates by normalized thermally stimulated current spectroscopy: Comparison of 100 and 150 mm wafers

✍ Scribed by Z. Q. Fang; D. C. Look; M. G. Mier

• Book ID: 107457778
• Publisher: Springer US
• Year: 1998
• Tongue: English
• Weight: 239 KB
• Volume: 27
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-998-0189-x