Characterization of DC, analog/RF, and low frequency noise in silicon-on-insulator nMOSFETs with different body-contact structures

✍ Scribed by Yang, Rong; Qian, He; Li, Junfeng; Xiong, Yong-Zhong; Shi, Jinling; Loh, Wei-Yip; Yu, Mingbin; Lo, Patrick Guo-Qiang; Balasubramanian, N.; Kwong, D.-L.

• Book ID: 123329263
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 778 KB
• Volume: 80
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2012.09.011