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Characterization of CZT crystals grown by the boron oxide encapsulated vertical Bridgman technique for the preparation of X-ray imaging detectors

✍ Scribed by Laura Marchini; Nicola Zambelli; Giovanni Piacentini; Mingzheng Zha; Davide Calestani; Eduard Belas; Andrea Zappettini


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
374 KB
Volume
633
Category
Article
ISSN
0168-9002

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