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Characterization of crack-tip field and constraint for bending specimens under large-scale yielding

✍ Scribed by Y.J. Chao; X.K. Zhu; Y. Kim; P.S. Lar; M.J. Pechersky; M.J. Morgan


Book ID
111582686
Publisher
Springer Netherlands
Year
2004
Tongue
English
Weight
553 KB
Volume
127
Category
Article
ISSN
1573-2673

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