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Characterization of contact resistance of low-value resistor by transmission line model (TLM) method

✍ Scribed by Kiichi Kamimura; Shinsuke Okada; Masato Nakao; Yoshiharu Onuma; Shozo Yamashita

Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 171 KB
Volume: 85
Category: Article
ISSN: 8756-663X
DOI: 10.1002/ecjb.1095

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## Abstract A stub leakage resistor at the nodes of an otherwise lossless TLM chain (i.e. without series resistors) introduces losses, although the corresponding absorption term in the Telegraphers' equation vanishes due to the absence of series resistors. This contradiction is outlined, an explana