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Characterization of annealed oxides on n-type 6HSiC by high- and low-frequency CV-measurements

✍ Scribed by E. Stein von Kamienski; A. Gölz; J. Stein; H. Kurz


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
331 KB
Volume
28
Category
Article
ISSN
0167-9317

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