Characterization of an exception to the ‘even-electron rule’ upon low-energy collision induced decomposition in negative ion electrospray tandem mass spectrometry

✍ Scribed by Yang Cai; Zhenzhen Mo; Nalaka S. Rannulu; Bing Guan; Srinivasan Kannupal; Bruce C. Gibb; Richard B. Cole

• Publisher: John Wiley and Sons
• Year: 2010
• Tongue: English
• Weight: 638 KB
• Volume: 45
• Category: Article
• ISSN: 1076-5174
• DOI: 10.1002/jms.1706

✦ Synopsis

Abstract

Electrospray‐generated precursor ions usually follow the ‘even‐electron rule’ and yield ‘closed shell’ fragment ions. We characterize an exception to the ‘even‐electron rule.’ In negative ion electrospray mass spectrometry (ES‐MS), 2‐(ethoxymethoxy)‐3‐hydroxyphenol (2‐hydroxyl protected pyrogallol) easily formed a deprotonated molecular ion (M‐H)^−^ at m/z 183. Upon low‐energy collision induced decomposition (CID), the m/z 183 precursor yielded a radical ion at m/z 124 as the base peak. The radical anion at m/z 124 was still the major fragment at all tested collision energies between 0 and 50 eV (E~lab~). Supported by computational studies, the appearance of the radical anion at m/z 124 as the major product ion can be attributed to the combination of a low reverse activation barrier and resonance stabilization of the product ions. Furthermore, our data lead to the proposal of a novel alternative radical formation pathway in the protection group removal of pyrogallol. Copyright © 2009 John Wiley & Sons, Ltd.