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Characterization of an amorphous GexSi1-xOy microbolometer for thermal imaging applications

✍ Scribed by Ahmed, A.H.Z.; Tait, R.N.

Book ID: 114617908
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 468 KB
Volume: 52
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.852545

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