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Characterization of alloyed AuGe/Ni/Au ohmic contacts to n-doped GaAs by measurement of transfer length and under the contact sheet resistance

✍ Scribed by Henry, H.G.


Book ID
114535848
Publisher
IEEE
Year
1989
Tongue
English
Weight
512 KB
Volume
36
Category
Article
ISSN
0018-9383

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