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Characterization of a subwavelength-scale 3D void structure using the FDTD-based confocal laser scanning microscopic image mapping technique

✍ Scribed by Choi, Kyongsik; Chon, James W.; Gu, Min; Lee, Byoungho


Book ID
115407944
Publisher
Optical Society of America
Year
2007
Tongue
English
Weight
710 KB
Volume
15
Category
Article
ISSN
1094-4087

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