Characterization of a defect layer at a Schottky barrier interface by current and capacitance measurements

✍ Scribed by A. Cola; M.G. Lupo; L. Vasanelli; A. Valentini

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 519 KB
• Volume: 36
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(93)90250-t