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Characterization of 4H-SiC Epitaxial Layers and High-Resistivity Bulk Crystals for Radiation Detectors

✍ Scribed by Mandal, Krishna C.; Muzykov, Peter G.; Krishna, Ramesh M.; Terry, J. Russell

Book ID: 118131747
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 918 KB
Volume: 59
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2012.2202916

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