✦ LIBER ✦
Characterization control, and use of dielectric charge effects in silicon technology : J. R. Szedon and R. M. Handy, J. Vac. Sci. Technol. 6 (1), Jan.–Feb. (1969), p. 1
- Book ID
- 103273195
- Publisher
- Elsevier Science
- Year
- 1970
- Tongue
- English
- Weight
- 105 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.