We present a synchrotron-based XPS investigation on the interface between InAs and Al 2 O 3 or HfO 2 layers, deposited by ALD at different temperatures, for InAs substrates with different surface orientations as well as for InAs nanowires. We reveal the composition of the native Oxide and how the hi
โฆ LIBER โฆ
Characterization by X-ray Photoemission Spectroscopy of the Open and Closed Forms of a Dithienylethene Switch in Thin Films
โ Scribed by Mendoza, S.M.; Lubomska, M.; Walko, M.; Feringa, B.L.; Rudolf, P.
- Book ID
- 126899147
- Publisher
- American Chemical Society
- Year
- 2007
- Tongue
- English
- Weight
- 129 KB
- Volume
- 111
- Category
- Article
- ISSN
- 1932-7447
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