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Characterization by TEM and image processing of rhodium supported on TiO2

✍ Scribed by S. Fuentes; A. Vázquez; R. Sllva; J.G. Pérez-Ramírez; M.J. Yacamán

Book ID
113178595
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
893 KB
Volume
111
Category
Article
ISSN
0021-9517

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## Abstract TiO~2~ and CeO~2~ are will known for inducing strong metal‐support interactions J(SMSI) of a different nature when used as supports for Pt catalysts. X‐ray photoelectron spectroscopy analysis of mixtures of TiO~2~CeO~2~ oxide supports (80:20 and 20:80) reveals at the surface a remarkab