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Characterization and quality control of silicon microstrip detectors with an infrared diode laser system

✍ Scribed by S. Shaheen; J. Boissevain; W. Collier; B.V. Jacak; J.S. Lock; P. Roybal; J. Simon-Gillo; W. Sondheim; J.P. Sullivan; H. Ziock


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
425 KB
Volume
352
Category
Article
ISSN
0168-9002

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