Characterization and modeling of step recovery diodes

✍ Scribed by Jian Zhang; Antti V. Räisänen

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 235 KB
• Volume: 17
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/(sici)1098-2760(19980220)17:3<200::aid-mop15>3.0.co;2-8

✦ Synopsis

limited to within 0.1% in many cases, and seldom exceed about 0.1%.

The MT method may be used to calculate the field intensity distribution, and to treat the more complicated boundary and mixed dielectric problems.