✦ LIBER ✦
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation
✍ Scribed by Y. Fu; H. Wong; J.J. Liou
- Book ID
- 104057899
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 448 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0026-2714
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