✦ LIBER ✦
Characterization and modeling of bias-stressed InGaP/GaAs collector-up tunneling-collector HBTs fabricated with boron-ion implantation
✍ Scribed by Mochizuki, K.; Tanaka, K.-I.; Uchiyama, H.; Ohta, H.; Terano, A.; Kikawa, T.; Taniguchi, T.; Mita, R.
- Book ID
- 114617984
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 749 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9383
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