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Characterization and Formation Mechanism of Six Pointed Star-Type Stacking Faults in 4H-SiC

✍ Scribed by Fangzhen Wu, Huanhuan Wang, Shayan Byrappa…


Book ID
120946232
Publisher
Springer US
Year
2013
Tongue
English
Weight
609 KB
Volume
42
Category
Article
ISSN
0361-5235

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A high density of double stacking faults consisting of six Si-C bilayers in cubic stacking sequence could be observed in 4H-SiC crystals with nitrogen doping concentrations exceeding 2 Â 10 19 cm À3 after annealing at temperatures above 1100 1C. The double stacking faults form by glide of two partia