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Characterization and electronic properties of the Tb/Si(111)7 × 7 interface

✍ Scribed by S. Kennou; J.-Y. Veuillen; T.A. Nguyen Tan


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
182 KB
Volume
56-58
Category
Article
ISSN
0169-4332

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