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Characterization and comparison of direct and indirect converting X-ray detectors for non-destructive testing (NDT) in low-energy and high-resolution applications

✍ Scribed by N. Uhlmann; M. Salamon; F. Sukowski; V. Voland


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
356 KB
Volume
591
Category
Article
ISSN
0168-9002

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