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Characteristics of various instability in Ni-FALC poly-Si thin film transistors

✍ Scribed by Jae Hoon Jung; Ji Hoon Shin; Young Je Cho; Duck Kyun Choi; Young Bae Kim


Book ID
113513998
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
372 KB
Volume
11
Category
Article
ISSN
1567-1739

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