Characteristics of low-leakage deep-trench diode for ESD protection design in 0.18-μm SiGe BiCMOS process

✍ Scribed by Shiao-Shien Chen; Tung-Yang Chen; Tien-Hao Tang; Jin-Lian Su; Tzer-Min Shen; Jen-Kon Chen

• Book ID: 114617151
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 604 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.814971