Characteristics of electron traps in rapidly thermal annealed GaAs using a capping proximity technique

✍ Scribed by G. Marrakchi; J.F. Joly; F. Vincent; G. Chaussemy; A. Laugier; G. Guillot

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 359 KB
• Volume: 36
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(89)90951-3