Characteristics and simulation analysis of GaN-based vertical light emitting diodes via wafer-level additional surface roughening process

✍ Scribed by Bae, Seong-Ju ;Choi, JeHyuk ;Kim, Dong-Hyun ;Ju, In-Chan ;Shin, Chan-Soo ;Ko, Chul-Gi ;Yu, Jae Su

• Book ID: 112180949
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 866 KB
• Volume: 209
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.201127557