✦ LIBER ✦
Characteristics and analysis of instability induced by secondary slow trapping in scaled CMOS devices : M. Noyori, J. Yasui, T. Ishihara and H. Higuchi. IEEE Trans. Reliab. R-32 (3), 323 (August 1983)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 139 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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