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Characteristic x-ray fluorescence correction in thin foil analysis

✍ Scribed by C. Nockolds; G. Cliff; G.W. Lorimer


Publisher
Elsevier Science
Year
1980
Weight
70 KB
Volume
11
Category
Article
ISSN
0047-7206

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With the help of a fundamental parameter program, the matrix e †ect of multi-component complex samples and the composition of each elementÏs X-ray Γ‘uorescence intensity were calculated. A mathematical model for correcting the multi-component matrix e †ect was deduced theoretically. It provides two m