Characteristic properties of Y2SiO5:Ce thin films grown with PLD
โ Scribed by E. Coetsee; J.J. Terblans; H.C. Swart
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 579 KB
- Volume
- 404
- Category
- Article
- ISSN
- 0921-4526
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