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Characteristic Analysis of SAW Filters Fabricated Using GaN Thin Films

✍ Scribed by Jeong, Hwan-Hee ;Kim, Sun-Ki ;Jung, Young-Chul ;Choi, Hyun-Chul ;Lee, Jung-Hee ;Lee, Yong-Hyun


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
153 KB
Volume
188
Category
Article
ISSN
0031-8965

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## Abstract The trap states at the front and back oxide interfaces and grain boundaries of polycrystalline silicon thin‐film transistors are evaluated by using electrical characteristic analysis and device simulation. First, the method for extracting the trap densities of the front and back oxide i