𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterisation of TiN and TiAlN thin films deposited on ground surfaces using focused ion beam milling

✍ Scribed by J. M. Cairney; S. G. Harris; L. W. Ma; P. R. Munroe; E. D. Doyle


Book ID
111590393
Publisher
Springer
Year
2004
Tongue
English
Weight
557 KB
Volume
39
Category
Article
ISSN
0022-2461

No coin nor oath required. For personal study only.