𝔖 Bobbio Scriptorium
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Characterisation of Epitaxial Laterally Overgrown Gallium Nitride Using Transmission Electron Microscopy

✍ Scribed by D.M. Tricker; K. Jacobs; C.J. Humphreys


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
309 KB
Volume
216
Category
Article
ISSN
0370-1972

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