Characterisation of BaxSr1−xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

✍ Scribed by P. Petrik; N.Q. Khánh; Z.E. Horváth; Z. Zolnai; I. Bársony; T. Lohner; M. Fried; J. Gyulai; C. Schmidt; C. Schneider; H. Ryssel

• Book ID: 117145745
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 347 KB
• Volume: 303
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/s0022-3093(02)00982-1