✦ LIBER ✦
Characterisation of a new batch of ion implanted Bi in silicon specimens for use as primary reference surface standards
✍ Scribed by I.V. Mitchell; H.L. Eschbach; L. Avaldi; W. Dobma
- Publisher
- Elsevier Science
- Year
- 1983
- Weight
- 397 KB
- Volume
- 218
- Category
- Article
- ISSN
- 0167-5087
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