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Characterisation of 60° misfit dislocations in SiGe alloy using nuclear microscopy

✍ Scribed by L. Huang; M.B.H. Breese; E.J. Teo

Book ID: 103859021
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 338 KB
Volume: 231
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2005.01.099

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