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Changing of density of states in amorphous silicon nitride at degradation of its electric propertoes using soft X-ray spectroscopy

✍ Scribed by A.I. Agafonov; E.P. Domashevskaya; E.N. Desyatirikova; V.N. Seleznev; V.A. Terekhov; G.G. Eldarov


Book ID
118334054
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
144 KB
Volume
97-98
Category
Article
ISSN
0022-3093

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