Change in Temperature Coefficient of Resistance of Heavily Doped Polysilicon Resistors Caused by Electrical Trimming

✍ Scribed by Kato, Kotaro; Ono, Terukazu

• Book ID: 118029096
• Publisher: Institute of Pure and Applied Physics
• Year: 1996
• Tongue: English
• Weight: 1008 KB
• Volume: 35
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/jjap.35.4209