Certification of High Purity Metals as Primary Reference Materials - A Challenge for Multielement Trace Analysis

✍ Scribed by Matschat, R. ;Czerwensky, M. ;Pattberg, S. ;Heinrich, H.-J.

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 388 KB
• Volume: 189
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200201)189:1<107::aid-pssa107>3.0.co;2-1