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Cathodoluminescence spectroscopy of deep defect levels at the ZnSe/GaAs interface with a composition-control interface layer

✍ Scribed by J. Schäfer; A. P. Young; T. M. Levin; L. J. Brillson; J. J. Paggel; L. Vanzetti; A. Franciosi


Book ID
107458016
Publisher
Springer US
Year
1999
Tongue
English
Weight
169 KB
Volume
28
Category
Article
ISSN
0361-5235

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