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CASTAM: A process variation analysis simulator for MOS LSI's

✍ Scribed by Aoki, Y.; Toyabe, T.; Asai, S.; Hagiwara, T.

Book ID: 114594885
Publisher: IEEE
Year: 1984
Tongue: English
Weight: 657 KB
Volume: 31
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1984.21733

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