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Case Study of Reliability-Aware and Low-Power Design

✍ Scribed by Yang, Shengqi; Wang, Wenping; Lu, Tiehan; Wolf, Wayne; Vijaykrishnan, N.; Xie, Yuan


Book ID
120836359
Publisher
IEEE
Year
2008
Tongue
English
Weight
935 KB
Volume
16
Category
Article
ISSN
1063-8210

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Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipati