✦ LIBER ✦
Carrier trapping centers and interface states induced by r.f. sputtering of molybdenum electrodes in MOS-structure diodes
✍ Scribed by Minoru Noda; Masanori Okuyama; Yoshihiro Hamakawa
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 662 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0038-1101
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