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Carrier Trapping and Recombination at Point Defects and Dislocations in MOCVD n-GaN

✍ Scribed by A. Hierro; M. Hansen; L. Zhao; J.S. Speck; U.K. Mishra; S.P. DenBaars; S.A. Ringel


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
205 KB
Volume
228
Category
Article
ISSN
0370-1972

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