𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Carrier profiles and collection efficiency in Gaussian p-n junctions under electron beam bombardment

✍ Scribed by Hoff, P.; Everhart, T.E.


Book ID
114589900
Publisher
IEEE
Year
1970
Tongue
English
Weight
641 KB
Volume
17
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.