Carrier multiplication and avalanche breakdown in selfaligned bipolar transistors : M. Reisch. Solid-St. Electron.33(2), 189 (1990)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 130 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90653-5